The Bal Spring® canted coil spring is a 3-in-1 solution to mechanical connecting, electrical conducting and EMI/RFI shielding challenges in equipment used for semiconductor fabrication and testing.
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KEMA Testing Validates Use of Spring Contact Element Performance in High-Current Applications
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Designing For Improved Signal Integrity in Downhole Tools
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Medical Electrical Connectors in Neuromodulation Devices
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